| Ask a Librarian | Get a Library Card

Record title

EBSD Strain Analysis of Epitaxial Si 1-x Ge x on Si

Record identifier

TN_cdi_crossref_primary_10_1017_S1431927611002984

Record permalink

https://collection.sl.nsw.gov.au/record/TN_cdi_crossref_primary_10_1017_S1431927611002984

Share

https://collection.sl.nsw.gov.au/record/TN_cdi_crossref_primary_10_1017_S1431927611002984

EBSD Strain Analysis of Epitaxial Si 1-x Ge x on Si

About this item

Full title

EBSD Strain Analysis of Epitaxial Si 1-x Ge x on Si

Author / Creator

Vaudin, M Stan, G DelRio, F Friedman, L Cook, R

Journal title

Microscopy and microanalysis, 2011, Vol.17 (S2), p.422-423

Record Identifier

TN_cdi_crossref_primary_10_1017_S1431927611002984

Language

English

Formats

Articles

More information

Scope and Contents

Contents

Alternative Titles

Full title

Authors, Artists and Contributors

Author / Creator

Identifiers

Primary Identifiers

Record Identifier

TN_cdi_crossref_primary_10_1017_S1431927611002984

Permalink

https://collection.sl.nsw.gov.au/record/TN_cdi_crossref_primary_10_1017_S1431927611002984

Other Identifiers

ISSN

E-ISSN

DOI

How to access this item

Online

01
Login with a Library card

Full text available

View in old catalogue

Connecting people and collections