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Analysis of the Conduction Mechanism and Copper Vacancy Density in p-type Cu2O Thin Films
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TN_cdi_doaj_primary_oai_doaj_org_article_064a34c83afb43f99bb7d088bb4b1b88
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https://collection.sl.nsw.gov.au/record/TN_cdi_doaj_primary_oai_doaj_org_article_064a34c83afb43f99bb7d088bb4b1b88
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Analysis of the Conduction Mechanism and Copper Vacancy Density in p-type Cu2O Thin Films
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Analysis of the Conduction Mechanism and Copper Vacancy Density in p-type Cu2O Thin Films
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London: Nature Publishing Group
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Scientific reports, 2017, Vol.7 (1), p.1-8
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TN_cdi_doaj_primary_oai_doaj_org_article_064a34c83afb43f99bb7d088bb4b1b88
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English
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TN_cdi_doaj_primary_oai_doaj_org_article_064a34c83afb43f99bb7d088bb4b1b88
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https://collection.sl.nsw.gov.au/record/TN_cdi_doaj_primary_oai_doaj_org_article_064a34c83afb43f99bb7d088bb4b1b88
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