SLNSW-Direct observation of the Si(110)-(16×2) surface ...-TN_cdi_doaj_primary_oai_doaj_org_article_e7bf756afa534c73a05384fcebd2201d

Direct observation of the Si(110)-(16×2) surface reconstruction by atomic force microscopy

Full title: Direct observation of the Si(110)-(16×2) surface reconstruction by atomic force microscopy

Author/creator: Yamamoto, Tatsuya, Izumi, Ryo, Miki, Kazushi, Yamasaki, Takahiro, Sugawara, Yasuhiro, Li, Yan Jun.

Call Numbers:

Record Identifier: TN_cdi_doaj_primary_oai_doaj_org_article_e7bf756afa534c73a05384fcebd2201d

Language: English

Formats: Articles

Publishers: Trakehner Str. 7-9, 60487 Frankfurt am Main, Germany: Beilstein-Institut

Permalink: https://collection.sl.nsw.gov.au/record/TN_cdi_doaj_primary_oai_doaj_org_article_e7bf756afa534c73a05384fcebd2201d

Articles

Articles

Export this record

Export selected records

  • Export to excel
  • Permalink

    • Export record to excel

    File type to download

    Beta version

    Record title

    Direct observation of the Si(110)-(16×2) surface reconstruction by atomic force microscopy

    Record identifier

    TN_cdi_doaj_primary_oai_doaj_org_article_e7bf756afa534c73a05384fcebd2201d

    Record permalink

    https://collection.sl.nsw.gov.au/record/TN_cdi_doaj_primary_oai_doaj_org_article_e7bf756afa534c73a05384fcebd2201d

    Share

    Direct observation of the Si(110)-(16×2) surface reconstruction by atomic force microscopy

    ACCESS
    https://collection.sl.nsw.gov.au/record/TN_cdi_doaj_primary_oai_doaj_org_article_e7bf756afa534c73a05384fcebd2201d

    Direct observation of the Si(110)-(16×2) surface reconstruction by atomic force microscopy

    Full title

    Direct observation of the Si(110)-(16×2) surface reconstruction by atomic force microscopy

    Author / Creator

    Yamamoto, Tatsuya ; Izumi, Ryo ; Miki, Kazushi ; Yamasaki, Takahiro ; Sugawara, Yasuhiro ; Li, Yan Jun

    Publisher

    Trakehner Str. 7-9, 60487 Frankfurt am Main, Germany: Beilstein-Institut

    Journal title

    Beilstein journal of nanotechnology, 2020, Vol.11 (1), p.1750-1756

    Record Identifier

    TN_cdi_doaj_primary_oai_doaj_org_article_e7bf756afa534c73a05384fcebd2201d

    Language

    English

    Formats

    Articles

    Publication information

    Publisher

    Subjects

    Subjects and topics

    atomic force microscopy (AFM) Letter Nanoscience Nanotechnology noncontact atomic force microscopy (NC-AFM) si Si-(16×2)

    More information

    — SCOPE AND CONTENTS

    Contents

    — ALTERNATIVE TITLES

    Full title

    — AUTHORS, ARTISTS AND CONTRIBUTORS

    Author / Creator

    Identifiers

    — PRIMARY IDENTIFIERS

    Record Identifier

    TN_cdi_doaj_primary_oai_doaj_org_article_e7bf756afa534c73a05384fcebd2201d

    Permalink

    https://collection.sl.nsw.gov.au/record/TN_cdi_doaj_primary_oai_doaj_org_article_e7bf756afa534c73a05384fcebd2201d

    — OTHER IDENTIFIERS

    ISSN

    E-ISSN

    DOI

    How to access this item

    Online

    1 item

    How to access?

    Login with a Library card

    Full text available >

    View in old catalogue

    Connecting people and collections