SLNSW-Effects of probe downforce and bias voltage on el...-TN_cdi_proquest_journals_2566023087

Effects of probe downforce and bias voltage on electrochemical atomic force microscopy nanomachining of copper materials

Full title: Effects of probe downforce and bias voltage on electrochemical atomic force microscopy nanomachining of copper materials

Author/creator: Huang, Jen-Ching, Hu, Yaozeng, Liao, Yi-Chia, Chou, Hui-Shan.

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Record Identifier: TN_cdi_proquest_journals_2566023087

Language: English

Formats: Articles

Publishers: Bristol: IOP Publishing

Permalink: https://collection.sl.nsw.gov.au/record/TN_cdi_proquest_journals_2566023087

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    Record title

    Effects of probe downforce and bias voltage on electrochemical atomic force microscopy nanomachining of copper materials

    Record identifier

    TN_cdi_proquest_journals_2566023087

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    https://collection.sl.nsw.gov.au/record/TN_cdi_proquest_journals_2566023087

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    Effects of probe downforce and bias voltage on electrochemical atomic force microscopy nanomachining of copper materials

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    https://collection.sl.nsw.gov.au/record/TN_cdi_proquest_journals_2566023087

    Effects of probe downforce and bias voltage on electrochemical atomic force microscopy nanomachining of copper materials

    Full title

    Effects of probe downforce and bias voltage on electrochemical atomic force microscopy nanomachining of copper materials

    Author / Creator

    Huang, Jen-Ching ; Hu, Yaozeng ; Liao, Yi-Chia ; Chou, Hui-Shan

    Publisher

    Bristol: IOP Publishing

    Journal title

    Journal of physics. Conference series, 2019, Vol.1176 (5), p.52066

    Record Identifier

    TN_cdi_proquest_journals_2566023087

    Language

    English

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    Articles

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    Atomic force microscopy Bias Copper Downforce Electric potential Machining Microscopy Phosphoric acid Voltage

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    TN_cdi_proquest_journals_2566023087

    Permalink

    https://collection.sl.nsw.gov.au/record/TN_cdi_proquest_journals_2566023087

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