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EBSD Strain Analysis of Epitaxial Si1-x Gex on Si
Record identifier
TN_cdi_proquest_journals_896617548
Record permalink
https://collection.sl.nsw.gov.au/record/TN_cdi_proquest_journals_896617548
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EBSD Strain Analysis of Epitaxial Si1-x Gex on Si
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EBSD Strain Analysis of Epitaxial Si1-x Gex on Si
Full title
EBSD Strain Analysis of Epitaxial Si1-x Gex on Si
Author / Creator
Vaudin, M ; Stan, G ; DelRio, F ; Friedman, L ; Cook, R
Publisher
New York, USA: Cambridge University Press
Journal title
Microscopy and microanalysis, 2011, Vol.17 (S2), p.422-423
Record Identifier
TN_cdi_proquest_journals_896617548
Language
English
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TN_cdi_proquest_journals_896617548
Permalink
https://collection.sl.nsw.gov.au/record/TN_cdi_proquest_journals_896617548
